Characterization of implant device materials using...

Journal of Chromatography A 2004 Vol. 1034; Iss. 1-2

Characterization of implant device materials using size-exclusion chromatography with mass spectrometry and with triple detection

X.Michael Liu, E.Peter Maziarz, David J Heiler
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Volume:
1034
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.chroma.2004.02.031
File:
PDF, 167 KB
english, 2004
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