[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Random dynamic voltage scaling design to enhance security of NCL S-box
Sui, Chunchun, Wu, Jun, Shi, Yiyu, Kim, Yong-Bin, Choi, MinsuYear:
2011
Language:
english
DOI:
10.1109/mwscas.2011.6026673
File:
PDF, 1.64 MB
english, 2011