[IEEE 2011 IEEE International Conference on Advanced Power System Automation and Protection (APAP) - Beijing, China (2011.10.16-2011.10.20)] 2011 International Conference on Advanced Power System Automation and Protection - Probabilistic risk assessment for an optimal selection of voltage sag mitigation devices using stochastic estimation of voltage sags
Han, Jong-Hoon, Jang, Gilsoo, Park, Chang-HyunYear:
2011
Language:
english
DOI:
10.1109/apap.2011.6180680
File:
PDF, 1.10 MB
english, 2011