[IEEE 1992 IEEE Microwave Symposium Digest MTT-S - Albuquerque, NM, USA (1-5 June 1992)] 1992 IEEE Microwave Symposium Digest MTT-S - Reliability analysis of microwave GaAs/AlGaAs HBTs with beryllium and carbon doped base
Yamada, F.M., Oki, A.K., Streit, D.C., Saito, Y., Umemoto, D.K., Tran, L.T., Bui, S., Velebir, J.R., McIver, G.W.Year:
1992
Language:
english
DOI:
10.1109/mwsym.1992.188091
File:
PDF, 292 KB
english, 1992