Time aberrations of uniform fields: An improved reflectron mass spectrometer for an atom-probe field-ion microscope
Scheinfein, M. R., Seidman, D. N.Volume:
64
Year:
1993
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1144319
File:
PDF, 1.00 MB
english, 1993