Novel program versus disturb window characterization for...

IEEE Electron Device Letters 2005 / 03 Vol. 26; Iss. 3

Novel program versus disturb window characterization for split-gate flash cell

Hung-Cheng Sung,, Tan Fu Lei,, Te-Hsun Hsu,, Ya-Chen Kao,, Yung-Tao Lin,, Wang, C.S.
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Volume:
26
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2004.842643
Date:
March, 2005
File:
PDF, 178 KB
english, 2005
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