[IEEE 2009 16th IEEE International Symposium on the...

  • Main
  • [IEEE 2009 16th IEEE International...

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - A novel Negative Bias Temperature Instability model for nanoscale Finfet

Chenyue Ma,, Bo Li,, He, Frank, Zhang, Xing, Lin, Xinnan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232688
File:
PDF, 4.40 MB
english, 2009
Conversion to is in progress
Conversion to is failed