Random testing of integrated circuits

Random testing of integrated circuits

David, Rene, Thevenod-Fosse, Pascale
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Volume:
IM-30
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.1981.6312432
Date:
March, 1981
File:
PDF, 1.41 MB
english, 1981
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