The effect of near-interface network strain on proton trapping in SiO/sub 2/
Vanheusden, K., Korambath, P.P., Kurtz, H.A., Karna, S.P., Fleetwood, D.M., Shedd, W.M., Pugh, R.D.Volume:
46
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.819121
Date:
January, 1999
File:
PDF, 438 KB
english, 1999