[IEEE Conference on Electron Devices, 2005 Spanish -...

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[IEEE Conference on Electron Devices, 2005 Spanish - Tarragona, Spain (2-4 Feb. 2005)] Conference on Electron Devices, 2005 Spanish - Characterization and optimization of ZnO films for SAW devices

Sayago, I., Aleixandre, M., Fernandez, M.J., Fontecha, J.L., Ares, L., Gutierez, F.J., Gracia, I., Horrillo, M.C.
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Year:
2005
Language:
english
DOI:
10.1109/sced.2005.1504500
File:
PDF, 445 KB
english, 2005
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