Characterization of Pb(Zr,Ti)O 3...

Integrated Ferroelectrics 1997 / 02 Vol. 15; Iss. 1-4

Characterization of Pb(Zr,Ti)O 3 thin films by MOCVD using the total reflection X-ray diffraction method

Fujisawa, Hironori, Shimizu, Masaru, Shiosaki, Tadashi
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Volume:
15
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708015691
Date:
February, 1997
File:
PDF, 542 KB
english, 1997
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