[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Full 3D Simulation of 6T-SRAM Cells for the 22nm Node
Shin, Changhwan, Tsukamoto, Yasumasa, Sun, Xin, Liu, Tsu-Jae KingYear:
2009
Language:
english
DOI:
10.1109/sispad.2009.5290253
File:
PDF, 2.34 MB
english, 2009