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[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Recent progress in research of structural defects in 6H-SiC single crystals
Xiangang Xu,, Yuqiang Gao,, Xiaobo Hu,, Wanxia Huang,, Qingxi Yuan,Year:
2009
Language:
english
DOI:
10.1109/edssc.2009.5394265
File:
PDF, 3.58 MB
english, 2009