Reduction of reverse-bias leakage current in Schottky...

Reduction of reverse-bias leakage current in Schottky diodes on GaN grown by molecular-beam epitaxy using surface modification with an atomic force microscope

Miller, E. J., Schaadt, D. M., Yu, E. T., Poblenz, C., Elsass, C., Speck, J. S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
91
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1478793
File:
PDF, 574 KB
english, 2002
Conversion to is in progress
Conversion to is failed