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[IEEE 2006 IEEE International Symposium on Circuits and Systems - Island of Kos, Greece (21-24 May 2006)] 2006 IEEE International Symposium on Circuits and Systems - Mismatch effect analyses in CMOS tapered buffers
Aragao, A.J., Navarro, J., Van Noije, W.A.M.Year:
2006
Language:
english
DOI:
10.1109/iscas.2006.1693119
File:
PDF, 2.29 MB
english, 2006