Instrumentation developments in scanning soft x-ray microscopy at the NSLS (invited)
Williams, Shawn, Jacobsen, Chris, Kirz, Janos, Maser, Jörg, Wirick, Sue, Zhang, Xiaodong, Ade, Harald, Rivers, MarkVolume:
66
Year:
1995
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1146020
File:
PDF, 873 KB
english, 1995