![](/img/cover-not-exists.png)
[IEEE 2010 IEEE International Conference on Imaging Systems and Techniques (IST) - Thessaloniki, Greece (2010.07.1-2010.07.2)] 2010 IEEE International Conference on Imaging Systems and Techniques - Process diagnostics and non-destructive testing using high-resolution gamma-ray tomography
Bieberle, Andre, Hoppe, Dietrich, Hampel, UweYear:
2010
Language:
english
DOI:
10.1109/ist.2010.5548452
File:
PDF, 2.29 MB
english, 2010