[IEEE 2010 IEEE International Conference on Imaging Systems...

  • Main
  • [IEEE 2010 IEEE International...

[IEEE 2010 IEEE International Conference on Imaging Systems and Techniques (IST) - Thessaloniki, Greece (2010.07.1-2010.07.2)] 2010 IEEE International Conference on Imaging Systems and Techniques - Process diagnostics and non-destructive testing using high-resolution gamma-ray tomography

Bieberle, Andre, Hoppe, Dietrich, Hampel, Uwe
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/ist.2010.5548452
File:
PDF, 2.29 MB
english, 2010
Conversion to is in progress
Conversion to is failed