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Identification of radiation-induced parasitic leakage paths...

IEEE Transactions on Nuclear Science 2004 / 10 Vol. 51; Iss. 5

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Shaneyfelt, M.R., Paiboon Tangyunyong,, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.
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Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.835074
Date:
October, 2004
File:
PDF, 737 KB
english, 2004
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