The single-event-effect behaviour of...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

The single-event-effect behaviour of commercial-off-the-shelf memory devices-A decade in low-Earth orbit

Underwood, C.I.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685222
Date:
June, 1998
File:
PDF, 850 KB
english, 1998
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