[IEEE 2010 IEEE Ultrasonics Symposium (IUS) - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International Ultrasonics Symposium - Using high frequency acoustic micro imaging to detect defects in artificial micro void specimens
Tabaru, Marie, Azuma, Takashi, Hashiba, Kunio, Maruyama, Takahisa, Kenbo, YukioYear:
2010
Language:
english
DOI:
10.1109/ultsym.2010.5935450
File:
PDF, 1.67 MB
english, 2010