![](/img/cover-not-exists.png)
[IEEE 2008 European Microwave Integrated Circuit Conference (EuMIC) - Amsterdam, Netherlands (2008.10.27-2008.10.28)] 2008 European Microwave Integrated Circuit Conference - A Methodology to Characterize the Low-Frequency Noise of InP Based Transistors
de Souza, A. A. Lisboa, Nallatamby, J. C., Prigent, M.Year:
2008
Language:
english
DOI:
10.1109/emicc.2008.4772244
File:
PDF, 581 KB
english, 2008