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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - An effective gate resistance model for CMOS RF and noise modeling
Xiaodong Jin,, Jia-Jiunn Ou,, Chih-Hung Chen,, Weidong Liu,, Deen, M.J., Gray, P.R., Chenming Hu,Year:
1998
Language:
english
DOI:
10.1109/iedm.1998.746514
File:
PDF, 292 KB
english, 1998