Scanning magnetoresistance microscopy of atom chips

Review of Scientific Instruments 2008 Vol. 79; Iss. 2

Scanning magnetoresistance microscopy of atom chips

Volk, M., Whitlock, S., Wolff, C. H., Hall, B. V., Sidorov, A. I.
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2839015
File:
PDF, 562 KB
english, 2008
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