Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2010 Vol. 28; Iss. 4
Survey of fractured SrTiO[sub 3] surfaces: From the micrometer to nanometer scale
Chien, TeYu, Guisinger, Nathan P., Freeland, John W.Volume:
28
Year:
2010
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3420395
File:
PDF, 522 KB
english, 2010