Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2011 Vol. 29; Iss. 5
Removing imperceptible fluoride residue after chemical dry-cleaning to fabricate uniform low-resistance NiSi film
Futase, Takuya, Tanioto, Hisanori, Kimoto, Mitsuo, Tsugane, Hideaki, Suzuki, Hidenori, Tobimatsu, HiroshiVolume:
29
Year:
2011
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3622301
File:
PDF, 1.13 MB
english, 2011