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[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - A Test Strategy for Time-to-Digital Converters Using Dynamic Element Matching and Dithering
Wenbo Liu,, Hanqing Xing,, Le Jin,, Geiger, R., Degang Chen,Year:
2005
Language:
english
DOI:
10.1109/iscas.2005.1465460
File:
PDF, 238 KB
english, 2005