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[IEEE IEEE 6th International Vacuum Microelectronics Conference (IVMC) - Newport, RI, USA (12-15 July 1993)] [Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference - Bright-field Analysis Of Field-emission Cones Using High-resolution Transmission Electron Microscopy
Goodhue, W.D., Nitishin, P.M., Harris, C.T., Bozler, C.O., Rathman, D.D., Johnson, G.D., Hollis, M.A.Year:
1993
Language:
english
DOI:
10.1109/ivmc.1993.700305
File:
PDF, 175 KB
english, 1993