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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - A new method for measuring accurate equivalent source reflection coefficient of three-port devices
Shimaoka, K.Year:
2010
Language:
english
DOI:
10.1109/cpem.2010.5544759
File:
PDF, 146 KB
english, 2010