[IEE IEE Colloquium on Fault Diagnosis in Process Systems - London, UK (21 April 1997)] IEE Colloquium on Fault Diagnosis in Process Systems - Tool condition monitoring in metal cutting through application of MLP neural networks
Dimla, D.E.Volume:
1997
Year:
1997
Language:
english
DOI:
10.1049/ic:19970944
File:
PDF, 266 KB
english, 1997