[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Soft breakdown in MgO dielectric layers
Miranda, E., O'Connor, E., Hughes, G., Casey, P., Cherkaoui, K., Monaghan, S., Long, R., O'Connell, D., Hurley, P.K.Year:
2009
Language:
english
DOI:
10.1109/irps.2009.5173330
File:
PDF, 224 KB
english, 2009