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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Soft breakdown in MgO dielectric layers

Miranda, E., O'Connor, E., Hughes, G., Casey, P., Cherkaoui, K., Monaghan, S., Long, R., O'Connell, D., Hurley, P.K.
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Year:
2009
Language:
english
DOI:
10.1109/irps.2009.5173330
File:
PDF, 224 KB
english, 2009
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