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[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Algorithms for ADC Multi-site Test with Digital Input Stimulus
Sheng, Xiaoqin, Kerkhoff, Hans, Zjajo, Amir, Gronthoud, GuidoYear:
2009
Language:
english
DOI:
10.1109/ets.2009.17
File:
PDF, 264 KB
english, 2009