ESD Avoiding Circuits for Solving OTP Memory Falsely...

IEEE Circuits and Systems Magazine 2010 Vol. 10; Iss. 2

ESD Avoiding Circuits for Solving OTP Memory Falsely Programmed Issues

Huang, Shao-Chang, Chen, Ke-Horng, Chen, Hsin-Ming, Ho, Ming-Chou, Shen, Rick
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Volume:
10
Year:
2010
Language:
english
Journal:
IEEE Circuits and Systems Magazine
DOI:
10.1109/mcas.2010.936784
File:
PDF, 2.27 MB
english, 2010
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