![](/img/cover-not-exists.png)
[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - An analytical model of the overshooting effect for multiple-input gates in nanometer technologies
Li Ding,, Jing Wang,, Zhangcai Huang,, Kurokawa, Atsushi, Inoue, YasuakiYear:
2013
Language:
english
DOI:
10.1109/iscas.2013.6572194
File:
PDF, 337 KB
english, 2013