![](/img/cover-not-exists.png)
[IEEE 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Montreal, QC, Canada (2010.07.6-2010.07.9)] 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics - A data decorrelation method for 3D position measurements from a line sensors based photogrammetric measuring system
Lin, Yu, Tu, Xiao-Wei, Perron, Claude, Xi, FengfengYear:
2010
Language:
english
DOI:
10.1109/aim.2010.5695874
File:
PDF, 356 KB
english, 2010