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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Development of mjtcs on fused silica substrates at nist

Lipe, T. E., Kinard, J. R., Scarioni, L.
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Year:
2010
Language:
english
DOI:
10.1109/cpem.2010.5543945
File:
PDF, 708 KB
english, 2010
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