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Topography, complex refractive index, and conductivity of graphene layers measured by correlation of optical interference contrast, atomic force, and back scattered electron microscopy
Vaupel, Matthias, Dutschke, Anke, Wurstbauer, Ulrich, Hitzel, Frank, Pasupathy, AbhayVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4831937
File:
PDF, 1.00 MB
english, 2013