The characterization of high electron mobility transistors...

The characterization of high electron mobility transistors using Shubnikov–de Haas oscillations and geometrical magnetoresistance measurements

Chang, Chian-Sern, Fetterman, Harold R., Viswanathan, Chand R.
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Volume:
66
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.343522
File:
PDF, 1.15 MB
english, 1989
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