The characterization of high electron mobility transistors using Shubnikov–de Haas oscillations and geometrical magnetoresistance measurements
Chang, Chian-Sern, Fetterman, Harold R., Viswanathan, Chand R.Volume:
66
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.343522
File:
PDF, 1.15 MB
english, 1989