[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Temperature dependence of breakdown in anisotropic 6H-SiC MOSFET
Li, Liu, Yin-tang, Yang, Chang-chun, ChaiYear:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734735
File:
PDF, 1.24 MB
english, 2008