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A cross-sectional atomic force microscopy study of nanocrystalline Ge precipitates in SiO[sub 2] formed from metastable Si[sub 1−x]Ge[sub x]O[sub 2]
Caragianis-Broadbridge, C., Blaser, J. M., Paine, D. C.Volume:
82
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.365962
File:
PDF, 648 KB
english, 1997