[IEEE 2004 IEEE International Reliability Physics...

  • Main
  • [IEEE 2004 IEEE International...

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Polarity dependence of charge trapping in poly-silicon gate HfO/sub 2/ MOSFETs

Bu, M., Wang, X.W., Guo, D.C., Song, L.Y., Ma, T.P., Tseng, H., Tobin, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315404
File:
PDF, 146 KB
english, 2004
Conversion to is in progress
Conversion to is failed