![](/img/cover-not-exists.png)
[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Polarity dependence of charge trapping in poly-silicon gate HfO/sub 2/ MOSFETs
Bu, M., Wang, X.W., Guo, D.C., Song, L.Y., Ma, T.P., Tseng, H., Tobin, P.Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315404
File:
PDF, 146 KB
english, 2004