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[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Hot topic session 12B: Stay relevant with standards-based DFT
Clark, C J, Champac, VictorYear:
2014
Language:
english
DOI:
10.1109/vts.2014.6818802
File:
PDF, 107 KB
english, 2014