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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Soft Error Hardened Latch Scheme for Enhanced Scan Based Delay Fault Testing
IKEDA, Takashi, NAMBA, Kazuteru, ITO, HideoYear:
2007
Language:
english
DOI:
10.1109/dft.2007.44
File:
PDF, 1.08 MB
english, 2007