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[IEEE 2011 Spanish Conference on Electron Devices (CDE) - Palma de Mallorca, Spain (2011.02.8-2011.02.11)] Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 - Dielectric breakdown recovery in ultrathin high-k gate stacks. Impact in MOSFETs and circuit performance
Crespo-Yepes, A., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X.Year:
2011
Language:
english
DOI:
10.1109/sced.2011.5744217
File:
PDF, 157 KB
english, 2011