Error analysis for refractive-index profile determination from near-field measurements
Helms, J., Schmidtchen, J., Schuppert, B., Petermann, K.Volume:
8
Language:
english
Journal:
Journal of Lightwave Technology
DOI:
10.1109/50.54467
Date:
May, 1990
File:
PDF, 725 KB
english, 1990