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[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Electrical and reliability characteristics of a scaled (∼30nm) tunnel barrier selector (W/Ta2O5/TaOx/TiO2/TiN) with excellent performance (JMAX > 107A/cm2)
Woo, Jiyong, Jeonghwan Song,, Kibong Moon,, Lee, Ji Hyun, Euijun Cha,, Prakash, Amit, Daeseok Lee,, Sangheon Lee,, Jaesung Park,, Yunmo Koo,, Chan Gyung Park,, Hyunsang Hwang,Year:
2014
Language:
english
DOI:
10.1109/vlsit.2014.6894431
File:
PDF, 1.09 MB
english, 2014