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[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Low Voltage Design against Power Analysis Attacks
Mirmotahari, O., Berg, Y.Year:
2008
Language:
english
DOI:
10.1109/delta.2008.50
File:
PDF, 434 KB
english, 2008