[IEEE 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Washington, DC, USA (2009.02.15-2009.02.19)] 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition - Internal Fault Detection and Isolation for Paralleled Voltage Source Converters
Di Zhang,, Wang, Fred, Burgos, Rolando, Kern, John, El-Barbari, Said, Boroyevich, DushanYear:
2009
Language:
english
DOI:
10.1109/apec.2009.4802758
File:
PDF, 7.16 MB
english, 2009