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[IEEE 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Bordeaux, France (2013.09.30-2013.10.3)] 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Comparative analysis of compact noise model formulations for SiGe-HBTs
Vitale, Francesco, van der Toorn, RamsesYear:
2013
Language:
english
DOI:
10.1109/bctm.2013.6798161
File:
PDF, 241 KB
english, 2013