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[IEEE 2013 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) - Rio de Janeiro, RJ, Brazil (2013.08.4-2013.08.7)] 2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC) - A free space measurement approach for dielectric material characterization
Rocha, Leno S., Junqueira, Cynthia C., Gambin, Ediana, Vicente, Alexandre Nata, Culhaoglu, Ali E., Kemptner, ErichYear:
2013
Language:
english
DOI:
10.1109/imoc.2013.6646474
File:
PDF, 1.26 MB
english, 2013