[IEEE TENCON 2007 - 2007 IEEE Region 10 Conference - Taipei, Taiwan (2007.10.30-2007.11.2)] TENCON 2007 - 2007 IEEE Region 10 Conference - Impact-factor-guided X-filling for peak power reduction during test
Li, Jia, Hu, Yu, Li, XiaoweiYear:
2007
Language:
english
DOI:
10.1109/tencon.2007.4429150
File:
PDF, 218 KB
english, 2007